Basic parameters | ||
Working Priciple | Energy Dispersive X-Ray Fluorescence | |
Measurement & Weight | 450*650*350mm/32kg | |
Detection limit | 100ppm(Best substance effect) | |
Precision | ±10ppm~0.1% | |
Expanded uncertainty | ≤0.19% — | |
Operating Environment | Temperature-11~46°C Humidity≤70% | |
Operator requirement | Above senior middle school eduction | |
Instrument standard configuration | ||
High Voltage | 0~50kv(Made in China) 0~2mA | |
Detector | Si-pin 145Kev±5 | |
Main structure | High-strength metal frame and industry plastic shell | |
Integrated Computer | Intel SandyBridge highly integrated industrial motherboard & multi-point hand touch | |
Testable Elements | Any 20 Eelements from whole elements(Na~U) |