Fault finding on transistors by the MOS transistor testing selector

Fault finding on transistors by the MOS transistor testing selector:

• Measure parameters: Open voltage UGS (th), internal resistance RDS, Transconductance gm, Withstand voltage V (BR) DS
• Test range: UGS (th) 0.1-9.9V; RDS 0.001-9.999Ω gm; 0.10-10.00s; V (BR) DS 50-650V
• Test current range: 0.1A-5A adjustable, comply with different working situation
• Automatic selecting, out of limit alarming, advance the work efficiency
• The technique of testing RDS under the big-current, is advanced technique

Lisun Electronics Inc was found by Lisun Group in 2003. We have sales & service offices in Shanghai, Russia, India and Korea. In 2012, we built a high level products show room & lab center in Shanghai. Lisun Group has set up a new manufactory in China to research and develop the world high-technology CFL & LED Test Instruments. Its quality system has been strictly certified by ISO9001:2008. The Lisun Group products have been authenticated by the third party lab and were awarded by CE certificate. As a CIE Supportive Member, all of the test instruments produced by Lisun Group are designed according to CIE Standards.

Our main products are Goniophotometer, Spectroradiometer, Integrating Sphere, LED Test Instruments, CFL Test Instruments, Photometer and Colorimeter, EMC & EMI Testing,Electronic Ballast Tester, Electrical Safety Testing, Environmental Test Chamber, Plug and Switch Testing, AC and DC Power Supply and etc.

Lisun Group’s products have been sold to more than 120 countries and regions all over the world. It’s quality is well accepted by many world famous companies such as UL, SGS, NIST, NIM, UNDP, Philips, OSRAM and so on. Lisun Group wins thousands of customers’ trust with motto “Right Product, Right Price and Right Service”. We will continue presenting more and more high quality products to our customers in future.