DW-FTIR-530A FTIR Analyser FTIR Spectroscopy FTIR Spectrometer
DW-FTIR-530A FT-IR Spectrometer
FEATURES:
FTIR Spectrometer DW-FTIR-530 with fully independent intellectual property rights. Adhering to consistent excellent quality and superior performance, the new model obtains the best balance between intelligence and convenient operation, advance performance and low operation and maintenance cost. It is a good choice for basic science research analysis, production quality control,testing and detection in various fields.
l High sensitivity optical system: cube-corner Michelson interferometer combined with patented fixing mirror alignment technology(Utility model ZL 2013 2 0099730.2:fixing mirror alignment assembly),to ensure long term stability, without the need of dynamic alignment which needs extra complicated electronic circuits. Reflecting mirrors are coated with gold to provide the maximum light throughput and ensure the detection sensitivity.
l High stability modular partition design: compact structure modular design with layout on cast aluminum base and overall balance of mechanical robustness and partition heat dissipation, offering higher ability of deformation resistance and less sensitive to vibrations and thermal variations, greatly improves the mechanical stability and long term working stability of the instrument.
l Intelligent multi-sealed moisture-proof design: multiple sealed interferometer, large-capacity desiccant cartridge with visible window and easy replacement structure, real-time monitoring of temperature and humidity inside the interferometer, getting rid of influences of high temperature, high humidity and chemical corrosions to the optical system in many ways.
l Innovated integration electronic system: high sensitivity integrated DLATGS detector pre-amplifier technology, dynamic gain amplification technology, high precision 24-bit A/D conversion technology, real-time control and data processing technology, digital filter and network communication technology, ensuring high quality real-time data collection and high-speed transmission.
l Good anti-electromagnetic interference capability: The electronic system is designed to meet CE certification and electromagnetic compatibility requirements, minimizing electromagnetic radiation in design and technology,in line with green instrument designing concept.
l High intensity IR source assembly: High intensity, long lifetime IR source module, with the highest energy distributed in fingerprint region, adopts a reflex sphere design to obtain even and stable IR radiation. External isolated IR source module and large space heat dissipation chamber design provide higher thermal stability and stable optical interference.
l The sampling compartment, reserving accessory mounting holes on the base plate, is wide enough for various accessories such as Defused/Specular Reflection, ATR, Liquid cell, Gas cell, and IR microscope etc.
SPECIFICATIONS:
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Interferometer |
Cube-corner Michelson interferometer |
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Beam splitter |
Multilayer Ge coated KBr |
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Room temperature DLATGS module (standard) |
Temperature stabilized, high sensitivity DLATGS module (optional) |
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Wavenumber Range |
7800cm-1~350cm-1 |
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Resolution |
0.85 cm-1 |
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Signal to noise ratio |
Better than 20,000:1 (RMS value, at 2100cm-1 ~ 2000cm-1 or 2100cm-1 ~ 2200cm-1, resolution: 4cm-1, detector: DLATGS, 1 minute data collection) |
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±0.01 cm-1 |
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Scanning Speed |
Microprocessor control, different scanning speed selectable. |
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Software |
MainFTOS Suite software workstation, compatible to all version Windows OS |
Various specialized functional software modules (optional) |
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Communication |
Ethernet interface (standard) |
WIFI wireless communication (optional) |
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Data Output |
Standard data format, report generation and output |
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Status Diagnosis |
Power on self check, real-time temperature and humidity monitoring and reminders |
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Certification |
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3Q(Optional) |
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Environment Conditions |
Temperature: 10℃~30℃, humidity: less than 70% |
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Power Supply |
AC220V±22V,50Hz±1Hz |
AC110V(optional) |
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Dimensions & Weight |
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Accessories |
Transmission sample holder (Standard) |
Optional accessories such as gas cell, liquid cell, Defused/Specular Reflection, single/multi reflection ATR, etc. |
ACCESSORIES:
Diffuse/Specular Reflectance Accessory
It is a versatile diffuse reflectance and specular reflectance accessory. Diffuse reflection mode is used for transparent and powder sample analysis. Specular reflection mode is for measuring smooth reflective surface and coating surface.
l High light throughput
l Easy operation, no internal adjustment needed
l Optical aberration compensation
l Small light spot, able to measure micro samples
l Variable angle of incidence
l Fast change of powder cup
Horizontal ATR /Variable Angle ATR (30°~ 60°)
Horizontal ATR is suitable for the analysis of rubber, viscous liquid, large surface sample and pliable solids etc. Variable angle ATR is used for measurement of films, painting (coating) layers and gels etc.
l Easy installation and operation
l High light throughput
l Variable depth of IR penetration
IR Microscope
l Micro samples analysis, minimum sample size: 100µm (DTGS detector) and 20µm (MCT detector)
l Non-destructive sample analysis
l Translucent sample analysis
l Two measurement methods: transmission and reflection
l Easy sample preparation
Single Reflection ATR
It provides high throughput when measuring materials with high absorption, such as polymer, rubber, lacquer, fiber etc.
l High throughput
l Easy operation and high analytical efficiency
l ZnSe, Diamond, AMTIR, Ge and Si crystal plate can be selected according to application.
Accessory for Determination of Hydroxyl in IR Quartz
l Fast, convenient and accurate measurement of Hydroxyl content in IR quartz
l Direct measurement to IR quartz tube, no need to cut samples
l Accuracy: ≤ 1×10-6 (≤ 1ppm)
Accessory for Oxygen and Carbon in Silicon Crystal Determination
l Special silicon plate holder
l Automatic, fast and accurate measurement of oxygen and carbon in silicon crystal
l Lower detection limit: 1.0×1016cm-3 ( at room temperature)
l Silicon plate thickness: 0.4~4.0 mm
SiO2 Powder Dust Monitoring Accessory
l Special SiO2 powder dust monitoring software
l Fast and accurate measurement of SiO2 powder dust
Component Testing Accessory
l Fast and accurate measurement of the response of such components as MCT, InSb and PbS etc.
l Curve, peak wavelength, stop wavelength and D* etc can be presented.
Optic Fiber testing Accessory
l Easy and accurate measurement of the loss rate of IR optic fiber, overcoming the difficulties for fiber testing, since they are very thin, with very small light-passing holes and uneasy to fix.
Jewelry Inspection Accessory
l Accurate identification of jewelries.
Universal Accessories
l Fixed liquid cells and demountable liquid cells
l Gas cells with different pathlength
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